Model-based flight-test data labeling and rapid analysis technology | IEEE Conference Publication | IEEE Xplore

Model-based flight-test data labeling and rapid analysis technology


Abstract:

under the background of flight test data analysis’s digital transformation demand, this paper puts forward the Model-based flight-test data labeling and rapid analysis te...Show More

Abstract:

under the background of flight test data analysis’s digital transformation demand, this paper puts forward the Model-based flight-test data labeling and rapid analysis technology in the flight test data analysis. On the basis of the flight test standard test point library, build test data analysis model. With key technologies such as time sequence database, data feature extraction and human-computer interaction analysis, established the test data visual analysis platform that has been verified and applied in the flight test data analysis. This technology meet the user demand of test data analysis, improved the efficiency of flight test task analysis in telemetry monitoring.
Date of Conference: 25-27 August 2023
Date Added to IEEE Xplore: 03 November 2023
ISBN Information:
Conference Location: Nanjing, China

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