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Design automation towards reliable analog integrated circuits | IEEE Conference Publication | IEEE Xplore

Design automation towards reliable analog integrated circuits


Abstract:

Reliability is becoming one of the major concerns in designing integrated circuits in nanometer CMOS technologies. Problems related to degradation mechanisms like NBTI or...Show More

Abstract:

Reliability is becoming one of the major concerns in designing integrated circuits in nanometer CMOS technologies. Problems related to degradation mechanisms like NBTI or soft breakdown, as well as increased external interference such as caused by crosstalk and EMI, cause time-dependent circuit performance degradation. Variability only makes these things more severe. This creates a need for innovative design techniques and design tools that help designers coping with these reliability and variability problems. This tutorial paper gives a brief description of design tools for the efficient analysis and identification of reliability problems in analog circuits, as a first step towards the automated design of guaranteed reliable analog circuits.
Date of Conference: 07-11 November 2010
Date Added to IEEE Xplore: 03 December 2010
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Conference Location: San Jose, CA, USA

References

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