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Carbon nanotube imperfection-immune digital VLSI: Frequently asked questions updated | IEEE Conference Publication | IEEE Xplore

Carbon nanotube imperfection-immune digital VLSI: Frequently asked questions updated


Abstract:

Carbon Nanotube Field-Effect Transistors (CNFETs) are excellent candidates for designing highly energy-efficient future digital systems. However, carbon nanotubes (CNTs) ...Show More

Abstract:

Carbon Nanotube Field-Effect Transistors (CNFETs) are excellent candidates for designing highly energy-efficient future digital systems. However, carbon nanotubes (CNTs) are inherently highly subject to imperfections that pose major obstacles to robust CNFET digital VLSI. This paper summarizes commonly raised questions and concerns about CNFET technology through a series of frequently asked questions. The specific questions addressed in this paper are motivated by recent advances in the field since the publication of our earlier paper on frequently asked questions in the Proceedings of the 2009 Design Automation Conference.
Date of Conference: 07-10 November 2011
Date Added to IEEE Xplore: 15 December 2011
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Conference Location: San Jose, CA, USA

References

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