We describe a novel methodology to validate vision-based autonomous driving systems over different circuit corners with consideration of temperature variation and circuit aging. The proposed work is motivated by the fact that low-level circuit implementation may have a significant impact on system performance, even though such effects have not been appropriately taken into account today. Our approach seamlessly integrates the image data recorded under nominal conditions with comprehensive statistical circuit models to synthetically generate the critical corner cases for which an autonomous driving system is likely to fail. As such, a given automotive system can be robustly validated for these worst-case scenarios that cannot be easily captured by physical experiments.