Loading [MathJax]/extensions/TeX/ieee_stixext.js
Exam Preparation KIT Using Natural Language Processing | IEEE Conference Publication | IEEE Xplore

Exam Preparation KIT Using Natural Language Processing


Abstract:

Assessments are an important aspect of academics to monitor an individual's performance but they are often observed to cause unnecessary stress among students. Insufficie...Show More

Abstract:

Assessments are an important aspect of academics to monitor an individual's performance but they are often observed to cause unnecessary stress among students. Insufficient knowledge of exam patterns and expectations from students often lead to the students not expending their energy in the right direction. Moreover in an overpopulated world, it is impossible for an instructor to give one-on-one guidance to the students to ensure they are on the right track and to gauge their readiness for assessments. To overcome these challenges, this paper presents a Natural Language Processing based exam preparation kit acting as a complete guide to better equip students for the exam. This kit displays questions and assesses the students based on their response and awards marks as per the expected answer. The system tracks strong and weak areas of the student and assists in improving their performance. A sentence BERT model was finalised and used to implement the system after comparing various ways and reported a root mean squared error of 7.026734661% and standard deviation of 6.493339783%.
Date of Conference: 06-08 July 2021
Date Added to IEEE Xplore: 03 November 2021
ISBN Information:
Conference Location: Kharagpur, India

References

References is not available for this document.