Integrated Circuit IO Characteristic Intelligent System | IEEE Conference Publication | IEEE Xplore

Integrated Circuit IO Characteristic Intelligent System


Abstract:

With the fast development of IC industry, IC test industry has become an indispensable link [1]. As for the disadvantage in IC test, this paper introduces the design of i...Show More

Abstract:

With the fast development of IC industry, IC test industry has become an indispensable link [1]. As for the disadvantage in IC test, this paper introduces the design of integrated circuit package continuity test system. It realizes the electrical characteristic test in the early stage of chip, include package continuity test, chip end resistance (ODT) test and static current test. This system has high precision automatic test and compatible with other chip test through the reasonable structure, such as construct three-level relay switching network, adopt the form of child board and mother board, current detection circuit shift measurement design and so on.
Date of Conference: 15-18 May 2020
Date Added to IEEE Xplore: 16 June 2020
ISBN Information:
Conference Location: Shanghai, China

References

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