Abstract:
This paper investigates the detectability of parameter faults in linear, time-invariant, analog circuits. We show that there are inherent limitations with regard to analo...Show MoreMetadata
Abstract:
This paper investigates the detectability of parameter faults in linear, time-invariant, analog circuits. We show that there are inherent limitations with regard to analog fault detectability.
Published in: Proceedings. IEEE International Conference on Computer Design: VLSI in Computers and Processors
Date of Conference: 18-18 September 2002
Date Added to IEEE Xplore: 06 January 2003
Print ISBN:0-7695-1700-5
Print ISSN: 1063-6404
Contents 