Abstract:
Due to process variation, power-up values of embedded SRAM memory are unique for individual devices. They are used as SRAM fingerprints to identify integrated-circuits wh...Show MoreMetadata
Abstract:
Due to process variation, power-up values of embedded SRAM memory are unique for individual devices. They are used as SRAM fingerprints to identify integrated-circuits which is fundamental for security applications. The fingerprints, however, are sensitive to environmental changes. Consequently, during the identification process, errors may occur. To overcome this inherent nondeterminism, we provide a systematic approach to designing reliable SRAM-based identification system. We also discuss how to evaluate its system performance. We present a generic score-fusion-based matching recipe to identify devices with high confidence across a wide range of environmental conditions.
Published in: 2010 IEEE International Conference on Computer Design
Date of Conference: 03-06 October 2010
Date Added to IEEE Xplore: 29 November 2010
ISBN Information: