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A comparative study of wearout mechanisms in state-of-art microprocessors | IEEE Conference Publication | IEEE Xplore

A comparative study of wearout mechanisms in state-of-art microprocessors


Abstract:

In this work, we perform a comparative study of different wearout mechanisms affecting the state-of-art microprocessor systems. Taking into account the detailed thermal a...Show More

Abstract:

In this work, we perform a comparative study of different wearout mechanisms affecting the state-of-art microprocessor systems. Taking into account the detailed thermal and electrical stress profiles, we present a methodology to accurately estimate the lifetime due to each mechanism. The lifetime-limiting wearout mechanisms are highlighted using standard benchmarks along with the reliability-critical microprocessor functional units.
Date of Conference: 30 September 2012 - 03 October 2012
Date Added to IEEE Xplore: 13 December 2012
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Conference Location: Montreal, QC, Canada

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