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Utilization analysis of trim-enabled NAND flash memory | IEEE Conference Publication | IEEE Xplore

Utilization analysis of trim-enabled NAND flash memory


Abstract:

In this paper, we present a novel probabilistic model of the utilization for trim-enabled NAND flash memory devices. This model provides a simple and powerful method to r...Show More

Abstract:

In this paper, we present a novel probabilistic model of the utilization for trim-enabled NAND flash memory devices. This model provides a simple and powerful method to reason about the performance of NAND flash memory, given its capacity and the frequency of write operations.
Date of Conference: 11-14 January 2013
Date Added to IEEE Xplore: 28 March 2013
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Conference Location: Las Vegas, NV, USA

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