Reducing excessive journaling overhead in mobile devices with small-sized NVRAM | IEEE Conference Publication | IEEE Xplore

Reducing excessive journaling overhead in mobile devices with small-sized NVRAM


Abstract:

The excessive journaling degrades the performance and shortens the lifetime of NAND flash storage in mobile devices. We propose a novel journaling scheme that resolves th...Show More

Abstract:

The excessive journaling degrades the performance and shortens the lifetime of NAND flash storage in mobile devices. We propose a novel journaling scheme that resolves this problem by using small-sized NVRAM efficiently. Experimental results show that our proposed scheme outperforms EXT4 by up to 16.8 times for synthetic workloads. Also, for TPC-C SQLite benchmark, it enhances the transaction throughput by 20% and reduces the number of journal writes by 58% with only 16 MB NVRAM.
Date of Conference: 10-13 January 2014
Date Added to IEEE Xplore: 20 March 2014
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Conference Location: Las Vegas, NV, USA

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