On-Target Test Automation for an Embedded Digital Signal Processing Device | IEEE Conference Publication | IEEE Xplore

Abstract:

Test Automation of embedded systems is a challenging task, especially when dealing with specific components, such as Digital Signal Processing devices. In this article, w...Show More

Abstract:

Test Automation of embedded systems is a challenging task, especially when dealing with specific components, such as Digital Signal Processing devices. In this article, we present an architecture that uses a well-adopted and generic automation framework, the Robot Framework, by adding an abstraction layer in the embedded device firmware to perform calls to DSP functions or firmware modules. The presented architecture enables the execution of tests on the target device integrated with other software components which are tested in the Robot Framework.
Date of Conference: 07-09 January 2022
Date Added to IEEE Xplore: 15 March 2022
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Conference Location: Las Vegas, NV, USA

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