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A novel algorithm to extract open defects from industrial designs | IEEE Conference Publication | IEEE Xplore

A novel algorithm to extract open defects from industrial designs


Abstract:

Open defect is one of the most common defects in CMOS integrated circuits ICs. For a precise and realistic testing and diagnosis of this defect, it becomes mandatory to e...Show More

Abstract:

Open defect is one of the most common defects in CMOS integrated circuits ICs. For a precise and realistic testing and diagnosis of this defect, it becomes mandatory to extract its location and segments that disconnects from circuit's layout. However, current defect extraction algorithms are limited to bridging faults extraction. In this paper, we present a novel algorithm to extract potential open defects caused by defective vias. Experimental results on industrial designs showing the algorithm's performance are presented.
Date of Conference: 13-16 December 2009
Date Added to IEEE Xplore: 17 February 2010
ISBN Information:
Conference Location: Yasmine Hammamet, Tunisia

References

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