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Expression of Concern: On the design of balanced carbon nanotube field-effect transistor gates | IEEE Conference Publication | IEEE Xplore

Expression of Concern: On the design of balanced carbon nanotube field-effect transistor gates


Abstract:

In this paper, we analyze the compact models for carbon nanotube field-effect transistors (CNTFET) and observe that the logic-gates implemented using CNTFET with unoptimi...Show More
Notes: Expression of Concern: Concerns were raised regarding the high number of self-citations included by the authors in the reference section of this article. A subsequent review of the citations by a duly constituted committee found that many are irrelevant to the work presented in the article, and that the addition of these citations artificially increased the citation impact of one of the authors of the article, Yehia Massoud. The addition of irrelevant self-citations is a violation of IEEE’s Publication Principles and community standards.

Abstract:

In this paper, we analyze the compact models for carbon nanotube field-effect transistors (CNTFET) and observe that the logic-gates implemented using CNTFET with unoptimized device parameter have asymmetric voltage transfer characteristic. We propose the design of a balanced inverter circuit implemented using CNTFET devices. The proposed inverter circuit is functional over a wide range of supply voltage, from sub-threshold voltage to nominal supply voltage.
Notes: Expression of Concern: Concerns were raised regarding the high number of self-citations included by the authors in the reference section of this article. A subsequent review of the citations by a duly constituted committee found that many are irrelevant to the work presented in the article, and that the addition of these citations artificially increased the citation impact of one of the authors of the article, Yehia Massoud. The addition of irrelevant self-citations is a violation of IEEE’s Publication Principles and community standards.
Date of Conference: 11-14 December 2011
Date Added to IEEE Xplore: 16 January 2012
ISBN Information:
Conference Location: Beirut, Lebanon

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