Abstract:
Our analytical compact drain current model for undoped or lightly doped nanoscale FinFETs has been successfully used to predict variability in the electrical characterist...Show MoreMetadata
Abstract:
Our analytical compact drain current model for undoped or lightly doped nanoscale FinFETs has been successfully used to predict variability in the electrical characteristics of FinFETs. A simplified version of the model behaves almost as good as the analytical model but is more computational time efficient. Implementation of the models in verilog-A can be used to predict variability in circuits such as the inverter.
Date of Conference: 07-10 December 2014
Date Added to IEEE Xplore: 26 February 2015
Electronic ISBN:978-1-4799-4242-8