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Efficient local reflectional symmetries detection | IEEE Conference Publication | IEEE Xplore

Efficient local reflectional symmetries detection


Abstract:

In this paper, we present a novel framework for efficient multiple reflectional symmetric regions detection in real images. First, we present a fast operator to measure t...Show More

Abstract:

In this paper, we present a novel framework for efficient multiple reflectional symmetric regions detection in real images. First, we present a fast operator to measure the symmetry. Then based on the extracted edge image, the dilation and erosion operations are applied for potential regions. Finally, the symmetry axes are derived based on weighted principle component analysis (PCA). The experiments based on the proposed algorithm show encouraging results on real images even with small size local symmetric regions and complex backgrounds.
Date of Conference: 14-14 September 2005
Date Added to IEEE Xplore: 27 March 2006
Print ISBN:0-7803-9134-9

ISSN Information:

Conference Location: Genova, Italy

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