Salient point characterization for low resolution meshes | IEEE Conference Publication | IEEE Xplore

Salient point characterization for low resolution meshes


Abstract:

This paper deals with edge detection and vertex characterization of 3D meshes. First, a new measure is introduced, the saliency degree, which provide directly the shape i...Show More

Abstract:

This paper deals with edge detection and vertex characterization of 3D meshes. First, a new measure is introduced, the saliency degree, which provide directly the shape information of a vertex of the mesh without any curvature computation. The relationship between the saliency degree and the curvature is demonstrated for continuous and discontinuous 2D curves. Then, a description of the 3D operator is given. Finally, results on geometric and real objects are shown. The contributions of this work are the definition of a new 3D operator which is able to extract point characteristic on 3D low resolution mesh.
Date of Conference: 12-15 October 2008
Date Added to IEEE Xplore: 12 December 2008
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Conference Location: San Diego, CA, USA

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