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Circular spot detection and segmentation with rotating line local binary analysis | IEEE Conference Publication | IEEE Xplore

Circular spot detection and segmentation with rotating line local binary analysis


Abstract:

The circular spots appear as round local peaks/valleys in image space, and they reflect omnidirectional symmetry and Gaussian distribution characteristics. According to t...Show More

Abstract:

The circular spots appear as round local peaks/valleys in image space, and they reflect omnidirectional symmetry and Gaussian distribution characteristics. According to these observations, a novel rotating line scan operator is proposed to achieve feature analysis of the spot object. Experimental tests show that the proposed algorithm is robust to spots' appearance variation (size, local contrast and intensity). The method presents promising performance in various real images.
Date of Conference: 27-30 October 2014
Date Added to IEEE Xplore: 29 January 2015
Electronic ISBN:978-1-4799-5751-4

ISSN Information:

Conference Location: Paris, France

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