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Analysis of discontinuities created by a multilayer material in a rectangular waveguide using mode matching technique | IEEE Conference Publication | IEEE Xplore

Analysis of discontinuities created by a multilayer material in a rectangular waveguide using mode matching technique


Abstract:

This paper presents a new method to analyze the discontinuity of a multilayer dielectric material. The multilayer material sample is loaded in an X-band rectangular waveg...Show More

Abstract:

This paper presents a new method to analyze the discontinuity of a multilayer dielectric material. The multilayer material sample is loaded in an X-band rectangular waveguide and its two port S-parameters are simulated as a function of frequency using the software Ansoft HFSS. Also, by applying the mode matching technique, expressions for the S-parameters of the multilayer dielectric material as a function of complex permittivity of individual layers are developed. A single layer material formed by using materials such as Teflon, a number of two layer materials formed by combinations of plexiglass and Teflon and sample of three layer materials are also presented.
Date of Conference: 14-16 April 2014
Date Added to IEEE Xplore: 29 September 2014
ISBN Information:
Conference Location: Marrakech, Morocco

References

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