X-ray image classification using Random Forests with Local Binary Patterns | IEEE Conference Publication | IEEE Xplore

X-ray image classification using Random Forests with Local Binary Patterns


Abstract:

This paper presents a novel algorithm for the efficient classification of X-ray images to enhance the accuracy and performance. As for describing the characteristics of X...Show More

Abstract:

This paper presents a novel algorithm for the efficient classification of X-ray images to enhance the accuracy and performance. As for describing the characteristics of X-ray image, new Local Binary Patterns (LBP) is employed that allows simple and efficient feature extraction for texture information. To achieve fast and accurate classification task, Random Forests that is decision tree based ensemble classifier is applied. Comparing with other feature descriptors and classifiers, the testing results show that the proposed method improves accuracy, especially the speed for either training or testing.
Date of Conference: 11-14 July 2010
Date Added to IEEE Xplore: 20 September 2010
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Conference Location: Qingdao, China

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