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Skin reflectance modelling for face recognition | IEEE Conference Publication | IEEE Xplore

Skin reflectance modelling for face recognition


Abstract:

We present a parameter-free method for estimating the BRDF of a subject's skin from a single image. We show how the technique can be used for photometric correction as a ...Show More

Abstract:

We present a parameter-free method for estimating the BRDF of a subject's skin from a single image. We show how the technique can be used for photometric correction as a preprocessing step for face analysis tasks, and show its application to graphics by re-rendering faces with the different skin reflectance models.
Date of Conference: 26-26 August 2004
Date Added to IEEE Xplore: 20 September 2004
Print ISBN:0-7695-2128-2
Print ISSN: 1051-4651
Conference Location: Cambridge, UK

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