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BEN: A combinatorial testing-based fault localization tool | IEEE Conference Publication | IEEE Xplore

BEN: A combinatorial testing-based fault localization tool


Abstract:

We present a combinatorial testing-based fault localization tool called BEN. BEN takes as input three types of information, including the subject program, the source code...Show More

Abstract:

We present a combinatorial testing-based fault localization tool called BEN. BEN takes as input three types of information, including the subject program, the source code, an input parameter model, and a combinatorial test set created based on the input parameter model. It is assumed that the combinatorial test set has already been executed, and thus the execution status of each test is known. The output of BEN is a ranking of statements in terms of their likelihood to be faulty. In the fault localization process, a small number of additional tests are generated by BEN and need to be executed by the user. In this paper, we present the major user scenarios and the highlevel design of BEN. BEN is implemented in Java and provides a graphical user interface that provides friendly access to the tool.
Date of Conference: 13-17 April 2015
Date Added to IEEE Xplore: 14 May 2015
Electronic ISBN:978-1-4799-1885-0
Conference Location: Graz, Austria

References

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