Abstract:
In this paper structural and optical properties of the thin films containing metal (M = Zn and Cu) and 8-hydroxyquinoline are presented. The films were successfully grown...Show MoreMetadata
Abstract:
In this paper structural and optical properties of the thin films containing metal (M = Zn and Cu) and 8-hydroxyquinoline are presented. The films were successfully grown by physical vapor deposition (PVD) technique in high vacuum on transparent (glass) and semiconductor (n-type silicon) substrates kept at room temperature during the deposition process. Nyquist plots and Admittance as a function of frequency and wavelengths were in detail analyzed. Admittance spectroscopy is a power tool in the study of semiconductors. This diagnostic technique gives information about uncompensated conductance and capacitance of single and multilayer structures. We investigated conductance and capacitance of these thin films subjected lighting in the region of their strong absorption band.
Date of Conference: 01-05 July 2018
Date Added to IEEE Xplore: 27 September 2018
ISBN Information:
Electronic ISSN: 2161-2064