Abstract:
In this paper, we analyzed how does life and reliability of an integrated circuit is affected when it is operated in different regions under different temperatures. We ha...Show MoreMetadata
Abstract:
In this paper, we analyzed how does life and reliability of an integrated circuit is affected when it is operated in different regions under different temperatures. We have taken Fibonacci generator as our target circuit and LVCMOS as I/O standards. WPA and WPA2 (Wi-Fi Protected Access) key can be generated with Fibonacci generator. Here, thermal efficient green Fibonacci Generator is used to generate key for Wi-Fi Protected Access in order to make green communication possible under different room temperature. By analysis it is observed that at standard normal temperature (21°C), LVCMOS12 have 24%, 17.3% and 95.53% less junction temperature than LVCMOS25 at operating frequencies of 1 GHz, 10 GHz, and 100 GHz respectively, while at 1 THz, the junction temperature becomes 125°C, which causes unreliability for circuit and device may not operate at that frequency. For world's highest temperature (56.7°C), we achieve 0.97% and 8.29% reduction in junction temperature at 1 GHz and 10 GHz operating frequencies respectively. This design is implemented in verilog on virtex-6 FGPA. Usually for functioning of a device, the junction temperature is below 125°C.
Published in: 2014 6th International Congress on Ultra Modern Telecommunications and Control Systems and Workshops (ICUMT)
Date of Conference: 06-08 October 2014
Date Added to IEEE Xplore: 08 January 2015
Electronic ISBN:978-1-4799-5291-5