Abstract:
The aimed accuracies for the final TanDEM-X DEM of 10m absolute and 2m relative height error will be ensured by calibration data. One crucial data set for the relative ac...Show MoreMetadata
Abstract:
The aimed accuracies for the final TanDEM-X DEM of 10m absolute and 2m relative height error will be ensured by calibration data. One crucial data set for the relative accuracy is tie-points that connect adjacent DEM acquisitions in the approximately 4km-overlap-area with each other. In this paper an improved concept for tie-point candidates is presented that is based on averaging a larger region instead of comparing single points. This concept should be more robust against noise. It is validated by applying the DEM calibration on a simulated test area, as real TanDEM-X data was not yet available. Also, the DEM calibration will be validated for the first time on a larger “real” test site by applying the TanDEM-X processing scenario.
Date of Conference: 25-30 July 2010
Date Added to IEEE Xplore: 03 December 2010
ISBN Information: