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Crop Yield Modelling Applying Leaf Area Index Estimated from Sentinel-2 and Proba-V Data at JECAM site in Poland | IEEE Conference Publication | IEEE Xplore

Crop Yield Modelling Applying Leaf Area Index Estimated from Sentinel-2 and Proba-V Data at JECAM site in Poland


Abstract:

The study was carried out for agricultural area in Poland for the years 2016-2017. The aim of the project was to examine the applicability of vegetation parameters calcul...Show More

Abstract:

The study was carried out for agricultural area in Poland for the years 2016-2017. The aim of the project was to examine the applicability of vegetation parameters calculated from Sentinel-2 and PROBA-V satellite data for crop yield prognosis. The extensive field measurements have been carried out parallel to Sentinel-2 and Proba-V satellite overpasses in order to elaborate the best relationship between satellite data and in-situ measured LAI. Finally the prognosis model based on meteorological data with the periodical input of LAI for wheat yield prognosis has been applied. Additionally classification of crops over JECAM site in Wielkopolska district was performed for 2016 and 2017 to choose the fields with wheat and with other crops for further research.
Date of Conference: 22-27 July 2018
Date Added to IEEE Xplore: 04 November 2018
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Conference Location: Valencia, Spain

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