Abstract:
Purpose of this work is investigation of validity on redundancy techniques for soft-error mitigation in sequential elements such as flop-flops and latches. We have evalua...Show MoreMetadata
Abstract:
Purpose of this work is investigation of validity on redundancy techniques for soft-error mitigation in sequential elements such as flop-flops and latches. We have evaluated multi-cell-upset (MCU) in sequential elements through neutron acceleration experiments at Osaka Univ. We have calculated mitigation efficiency of the redundancy technique from the experimental results. MCU ratio increases with technology advancing. Validity of the redundancy technique is kept even on advanced technologies.
Published in: 2011 IEEE 17th International On-Line Testing Symposium
Date of Conference: 13-15 July 2011
Date Added to IEEE Xplore: 22 August 2011
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