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State-aware single event analysis for sequential logic | IEEE Conference Publication | IEEE Xplore

State-aware single event analysis for sequential logic


Abstract:

Single Event Effects in sequential logic cells represent the current target for analysis and improvement efforts in both industry and academia. We propose a state-aware a...Show More

Abstract:

Single Event Effects in sequential logic cells represent the current target for analysis and improvement efforts in both industry and academia. We propose a state-aware analysis methodology that improves the accuracy of Soft Error Rate data for individual sequential instances based on the circuit and application. Furthermore, we exploit the intrinsic imbalance between the SEU susceptibility of different flip-flop states to implement a low-cost SER improvement strategy. Careful, per-state SEE analysis of sequential cells also highlights SET phenomena in flip-flops. We apply de-rating techniques to accurately evaluate their contribution to the overall flip-flop SEE sensitivity.
Date of Conference: 08-10 July 2013
Date Added to IEEE Xplore: 19 September 2013
Electronic ISBN:978-1-4799-0664-2

ISSN Information:

Conference Location: Chania, Greece

References

References is not available for this document.