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Robotic dual probe setup for reliable pick and place processing on the nanoscale using haptic devices | IEEE Conference Publication | IEEE Xplore

Robotic dual probe setup for reliable pick and place processing on the nanoscale using haptic devices


Abstract:

This paper presents reproducible pick and place handling of particles within the sub micron range. The handling strategy is based on a robotic dual probe setup that is in...Show More

Abstract:

This paper presents reproducible pick and place handling of particles within the sub micron range. The handling strategy is based on a robotic dual probe setup that is integrated into a high resolution scanning electron microscope. By purposeful utilization of the predominant adhesive forces on the nanoscale, this setup facilitates the assembly of overall complex arrangements of different nanoparticles using haptic devices. The paper discusses control issues of the setup as well as the advantages and restrictions of the proposed technique.
Date of Conference: 14-18 September 2014
Date Added to IEEE Xplore: 06 November 2014
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ISSN Information:

Conference Location: Chicago, IL, USA

References

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