Abstract:
This paper presents reproducible pick and place handling of particles within the sub micron range. The handling strategy is based on a robotic dual probe setup that is in...Show MoreMetadata
Abstract:
This paper presents reproducible pick and place handling of particles within the sub micron range. The handling strategy is based on a robotic dual probe setup that is integrated into a high resolution scanning electron microscope. By purposeful utilization of the predominant adhesive forces on the nanoscale, this setup facilitates the assembly of overall complex arrangements of different nanoparticles using haptic devices. The paper discusses control issues of the setup as well as the advantages and restrictions of the proposed technique.
Date of Conference: 14-18 September 2014
Date Added to IEEE Xplore: 06 November 2014
ISBN Information: