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Muons and thermal neutrons SEU characterization of 28nm UTBB FD-SOI and Bulk eSRAMs | IEEE Conference Publication | IEEE Xplore

Muons and thermal neutrons SEU characterization of 28nm UTBB FD-SOI and Bulk eSRAMs


Abstract:

This work reports the complete SEU experimental characterization in 28nm commercial UTBB FDSOI and Bulk technologies subjected to low-energy muons (μ+) and thermal neutro...Show More

Abstract:

This work reports the complete SEU experimental characterization in 28nm commercial UTBB FDSOI and Bulk technologies subjected to low-energy muons (μ+) and thermal neutrons. FDSOI technology demonstrates a 10x SER decrease for thermal neutrons and a more than 10x SEU occurrence reduction for muons with respect to Bulk technology, evidencing the beneficial role of the UTBB architecture on its radiation hardness level.
Date of Conference: 19-23 April 2015
Date Added to IEEE Xplore: 01 June 2015
Electronic ISBN:978-1-4673-7362-3

ISSN Information:

Conference Location: Monterey, CA, USA

References

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