Abstract:
This work reports the complete SEU experimental characterization in 28nm commercial UTBB FDSOI and Bulk technologies subjected to low-energy muons (μ+) and thermal neutro...Show MoreMetadata
Abstract:
This work reports the complete SEU experimental characterization in 28nm commercial UTBB FDSOI and Bulk technologies subjected to low-energy muons (μ+) and thermal neutrons. FDSOI technology demonstrates a 10x SER decrease for thermal neutrons and a more than 10x SEU occurrence reduction for muons with respect to Bulk technology, evidencing the beneficial role of the UTBB architecture on its radiation hardness level.
Published in: 2015 IEEE International Reliability Physics Symposium
Date of Conference: 19-23 April 2015
Date Added to IEEE Xplore: 01 June 2015
Electronic ISBN:978-1-4673-7362-3