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Critical charge dependence of correlation of different neutron sources for soft error testing | IEEE Conference Publication | IEEE Xplore

Critical charge dependence of correlation of different neutron sources for soft error testing


Abstract:

We investigate the soft error rate (SER) deviations at sea level between calculation with JEDEC spectrum and measurements at acceleration test facilities. The ratio of SE...Show More

Abstract:

We investigate the soft error rate (SER) deviations at sea level between calculation with JEDEC spectrum and measurements at acceleration test facilities. The ratio of SER calculated with the test facility's spectrum to that with the JEDEC spectrum is provided as a function of critical charge. This ration is used for estimation of the SER at sea level from the SER measured at test facilities. Single event upset (SEU) cross-sections necessary in derivation of the SER ratio are given by a multi-scale (particle transport and 3D TCAD) Monte Carlo simulation. Finally, the SER ratio is verified through acceleration tests in three facilities.
Date of Conference: 19-23 April 2015
Date Added to IEEE Xplore: 01 June 2015
Electronic ISBN:978-1-4673-7362-3

ISSN Information:

Conference Location: Monterey, CA, USA

References

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