Abstract:
This work investigates the impact of package structure on single event upset (SEU) rate through neutron irradiation test and Monte Carlo simulation of the particles passa...Show MoreMetadata
Abstract:
This work investigates the impact of package structure on single event upset (SEU) rate through neutron irradiation test and Monte Carlo simulation of the particles passage. Irradiation test results show that the resin existing in the upper stream of the beam could increase SEU rate by about 10 %. The simulation result demonstrates that light secondary particles generated in the package materials, such as proton and alpha particles, contribute to the SEU rate elevation. Therefore, SEU rate evaluation should pay attention to the package structure especially for low voltage devices having low critical charge of 0.4 fC and below.
Published in: 2015 IEEE International Reliability Physics Symposium
Date of Conference: 19-23 April 2015
Date Added to IEEE Xplore: 01 June 2015
Electronic ISBN:978-1-4673-7362-3