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Alpha soft error rate of FDSOI 28 nm SRAMs: Experimental testing and simulation analysis | IEEE Conference Publication | IEEE Xplore

Alpha soft error rate of FDSOI 28 nm SRAMs: Experimental testing and simulation analysis


Abstract:

We report on soft error rate measurements on 28 nm commercial FDSOI SRAM bitcells under alpha irradiation. The technology proves to be experimentally quasi-immune to alph...Show More

Abstract:

We report on soft error rate measurements on 28 nm commercial FDSOI SRAM bitcells under alpha irradiation. The technology proves to be experimentally quasi-immune to alpha particles. Simulation results are also presented, through 3D-TCAD investigations of the transport mechanisms followed by Monte-Carlo simulations of the charge deposition.
Date of Conference: 19-23 April 2015
Date Added to IEEE Xplore: 01 June 2015
Electronic ISBN:978-1-4673-7362-3

ISSN Information:

Conference Location: Monterey, CA, USA

References

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