Abstract:
A concise 1-D analytical expression is derived for temperature evolution during pulsed heating. A decreasing exponential temperature profile is shown to be a good approxi...Show MoreMetadata
Abstract:
A concise 1-D analytical expression is derived for temperature evolution during pulsed heating. A decreasing exponential temperature profile is shown to be a good approximation for such a profile. It is used to estimate of the failure temperature Trail in two amorphous Indium-Gallium-Zinc Oxide (a-IGZO) TFT technologies and to calculate the onset temperature of negative differential resistance (NDR) in Germanium photodiodes.
Date of Conference: 31 March 2019 - 04 April 2019
Date Added to IEEE Xplore: 23 May 2019
ISBN Information: