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Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing | IEEE Conference Publication | IEEE Xplore
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Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing


Abstract:

CMOS integrated 4kbit 1T-1R memristive devices were examined in terms of device-to-device and pulse number dependent variability for the use in neuromorphic systems. Base...Show More

Abstract:

CMOS integrated 4kbit 1T-1R memristive devices were examined in terms of device-to-device and pulse number dependent variability for the use in neuromorphic systems. Based on the variability of polycrystalline HfO2 based Resistive Random Access Memory (RRAM)devices, reliability issues for the implementation of stochastic learning rules are investigated. The switching variability of the memristive devices is demonstrated as a function of the voltage amplitude and pulse number. We demonstrate that the switching probability of the filamentary RRAM devices can emulate analog synaptic functionality. Finally, the endurance and retention characteristics of the memristive devices are analyzed to evaluate the performance and reliability of the cells used for neuromorphic computing.
Date of Conference: 31 March 2019 - 04 April 2019
Date Added to IEEE Xplore: 23 May 2019
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Conference Location: Monterey, CA, USA

I. Introduction

Neuromorphic computing, which mimics the working of human brain, has seen a renewed attention since the advent of nano-technologies and the raise in demand for the automation [1], [2]. It is considered as the demand hardware for future artificial intelligence, autonomous driving systems, and complex analysis based tasks, such as image processing, signal processing, data-sensing and cognitive computing [3]. Both, hardware and software based approaches for implementing neuromorphic computing platforms are being progressively carried out [4], [5]. Using memristive devices, hardware based neuromorphic systems gained momentum in the last couple of years. RRAM based technologies are of particular interest due to their significant benefits ascribed to their CMOS compatibility [6]. To integrate RRAM devices in neuromorphic circuits, new methodologies improving the analog performance of filamentary RRAM arrays are required [7]. In this work, we utilize the HfO2 based 1T-1R RRAM devices to exhibit the analog performance of synapses. Instead of implementing discrete resistance states of binary devices into learning algorithms, the switching probability of the devices is employed to the synaptical activation function and provide a digital to analog conversion for synaptic information processing. In this respect, the device-to-device and pulse number dependent variability of the memristive devices is evaluated. Additionally, the performance and reliability of the devices used for neuromorphic computing are demonstrated through conventional endurance and retention measurements.

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References

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