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Dynamic vs Static Burn-in for 16nm Production | IEEE Conference Publication | IEEE Xplore

Dynamic vs Static Burn-in for 16nm Production


Abstract:

As the automotive industry moves toward autonomous driving and zero defect, production burn-in becomes more important, so is optimizing its efficiency. Although dynamic b...Show More

Abstract:

As the automotive industry moves toward autonomous driving and zero defect, production burn-in becomes more important, so is optimizing its efficiency. Although dynamic burn-in is considered more efficient than static in theory, there have been very few reported studies based on actual data. This work analyzes production burn-in data of ~34k units produced using TSMC's 16nm process, and shows that dynamic burn-in is approximately >4x as effective as static burn-in in catching early silicon failures.
Date of Conference: 28 April 2020 - 30 May 2020
Date Added to IEEE Xplore: 30 June 2020
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Conference Location: Dallas, TX, USA

References

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