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Reliability Studies on Advanced FinFET Transistors of the Intel 4 CMOS Technology | IEEE Conference Publication | IEEE Xplore

Reliability Studies on Advanced FinFET Transistors of the Intel 4 CMOS Technology


Abstract:

The Intel 4 CMOS FinFET technology delivers over 20% performance gains at iso-power over the prior generation (Intel 7). This paper reports reliability studies on the Int...Show More

Abstract:

The Intel 4 CMOS FinFET technology delivers over 20% performance gains at iso-power over the prior generation (Intel 7). This paper reports reliability studies on the Intel 4 technology that demonstrate matched or better reliability while extending Moore's law in the areas of power, performance, and scaling over its predecessor. Industry-leading technology scaling comes with numerous challenges, including co-optimization of yield, performance, and reliability. This paper reports the development of Intel 4 technology with industry-standard reliability while delivering significant advancement in generational performance and density.
Date of Conference: 26-30 March 2023
Date Added to IEEE Xplore: 15 May 2023
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Conference Location: Monterey, CA, USA

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