Abstract:
We present a new method for full-field mammogram analysis. A mammogram is analyzed region by region and is classified as normal or abnormal. We present methods for extrac...Show MoreMetadata
Abstract:
We present a new method for full-field mammogram analysis. A mammogram is analyzed region by region and is classified as normal or abnormal. We present methods for extracting features that can be used to distinguish normal and abnormal regions of a mammogram. We describe our classifier technique that uses a unique reclassification method to boost the classification performance. We have tested this technique on a set of ground-truth full-field mammograms.
Published in: 2004 2nd IEEE International Symposium on Biomedical Imaging: Nano to Macro (IEEE Cat No. 04EX821)
Date of Conference: 18-18 April 2004
Date Added to IEEE Xplore: 07 March 2005
Print ISBN:0-7803-8388-5