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Improved registration for large electron microscopy images | IEEE Conference Publication | IEEE Xplore

Improved registration for large electron microscopy images


Abstract:

In this paper we introduce a novel algorithm for alignment of Electron Microscopy images for 3D reconstruction. The algorithm extends the Expectation Maximization - Itera...Show More

Abstract:

In this paper we introduce a novel algorithm for alignment of Electron Microscopy images for 3D reconstruction. The algorithm extends the Expectation Maximization - Iterative Closest Points (EM-ICP) algorithm to go from point matching to patch matching. We utilize local patch characteristics to achieve improved registration. The method is applied to enable 3D reconstruction of Transmission Electron Microscopy (TEM) images. We demonstrate results on large TEM images and show the increased alignment accuracy of our approach.
Date of Conference: 28 June 2009 - 01 July 2009
Date Added to IEEE Xplore: 07 August 2009
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Conference Location: Boston, MA, USA

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