A new approach is proposed in this paper to detect the stuck faults in linear analog circuits. Ideal switches are inserted to indicate stuck-at, bridging and stuck-open locations. Then the resulting circuit is analyzed and stuck faults are directly identified. A recently developed method for multiple analog fault diagnosis is used eliminating a need for fault dictionary approach. The effect of locating stuck-at, bridging and stuck-open faults is modeled With full precision of resulting test conditions. An analog IC /spl mu/A741 - is given as an example.