Abstract:
An overview of the recent developments in the design techniques of CMOS phase detectors and an in-depth examination of the advantages and limitations of these techniques ...Show MoreMetadata
Abstract:
An overview of the recent developments in the design techniques of CMOS phase detectors and an in-depth examination of the advantages and limitations of these techniques are presented. Both linear and nonlinear phase detectors are examined. Critical design issues, such as, sampling mechanism, lock condition, sensitivity to input data pattern, and reliability are investigated in detail.
Published in: 2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353)
Date of Conference: 26-29 May 2002
Date Added to IEEE Xplore: 07 August 2002
Print ISBN:0-7803-7448-7
Contents 