Systematic test program generation for SoC testing using embedded processor | IEEE Conference Publication | IEEE Xplore

Systematic test program generation for SoC testing using embedded processor


Abstract:

Embedded processors are now widely used in system-on-chips. The computational power of such processors and their ease of access to/from other embedded cores can be utiliz...Show More

Abstract:

Embedded processors are now widely used in system-on-chips. The computational power of such processors and their ease of access to/from other embedded cores can be utilized to test SoCs. This paper presents a software-based testing of embedded cores in a system chip using the embedded processor We present a methodology to systematically generate test programs that test the processor and other cores in system chip. The method requires almost no overhead but provides great flexibility in terms of structural/fault coverage, test mechanism and future reuse.
Date of Conference: 25-28 May 2003
Date Added to IEEE Xplore: 20 June 2003
Print ISBN:0-7803-7761-3
Conference Location: Bangkok, Thailand

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