Integration of high voltage charge-pumps in a submicron standard CMOS process for programming analog floating-gate circuits | IEEE Conference Publication | IEEE Xplore

Integration of high voltage charge-pumps in a submicron standard CMOS process for programming analog floating-gate circuits


Abstract:

This paper presents integration of high voltage charge-pumps for programming analog floating-gate (FG) circuits in a standard 0.5 /spl mu/m CMOS N-well double poly proces...Show More

Abstract:

This paper presents integration of high voltage charge-pumps for programming analog floating-gate (FG) circuits in a standard 0.5 /spl mu/m CMOS N-well double poly process. In this research two different Dickson charge-pumps are integrated for the control of electron tunneling and hot-electron injection in a floating-gate element. A six stage design implemented with Schottky rectifiers is used to modulate tunneling and a three stage design using high voltage transistors is used to modulate injection. Controlling the frequency of the Schottky charge-pump is an on-chip clock. The on-chip clock, a 7 stage ring oscillator was designed to operate to approximately 10 MHz for controlling the Schottky charge-pump. Experimental results of hot-electron injection, clock performance and electron tunneling are presented.
Date of Conference: 23-26 May 2005
Date Added to IEEE Xplore: 25 July 2005
Print ISBN:0-7803-8834-8

ISSN Information:

Conference Location: Kobe, Japan

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