A background DAC error estimation in Sigma-Delta ADCs using a pseudo random noise based correlation technique | IEEE Conference Publication | IEEE Xplore

A background DAC error estimation in Sigma-Delta ADCs using a pseudo random noise based correlation technique


Abstract:

This paper presents a new approach for estimating nonidealities in unit element feedback digital-to-analog converters (DACs) of sigma-delta analog-to-digital converters (...Show More

Abstract:

This paper presents a new approach for estimating nonidealities in unit element feedback digital-to-analog converters (DACs) of sigma-delta analog-to-digital converters (SigmaDelta ADCs). The presented method involves a background correlation technique to determine static and dynamic device mismatches as well as a way to digitally correct a modulators output. Simulations show that the method can be used to precisely estimate imperfections and improve non-ideal modulators up to their ideal resolution. The method is defined mathematically and verified by simulations.
Date of Conference: 24-27 May 2009
Date Added to IEEE Xplore: 26 June 2009
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Conference Location: Taipei, Taiwan

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