Near-threshold startup integrated boost converter with slew rate enhanced error amplifier | IEEE Conference Publication | IEEE Xplore

Near-threshold startup integrated boost converter with slew rate enhanced error amplifier

Publisher: IEEE

Abstract:

An integrated voltage-mode boost converter that starts up at 0.9 V is successfully implemented in a standard 3.3/5 V 0.6 mum CMOS process with V tn =0.7 V and |V tp |=0.8...View more

Abstract:

An integrated voltage-mode boost converter that starts up at 0.9 V is successfully implemented in a standard 3.3/5 V 0.6 mum CMOS process with V tn =0.7 V and |V tp |=0.8 V. The special features are: (1) a near-threshold soft-start circuit that keeps maximum in-rush current under control; (2) a slew rate enhanced error amplifier that achieves stable response over a wide range of supply voltage; and (3) a capacitor multiplier in implementing the compensation capacitor that reduces die area. Maximum efficiency of 93% is achieved at an output power of 260 mW.
Date of Conference: 24-27 May 2009
Date Added to IEEE Xplore: 26 June 2009
ISBN Information:

ISSN Information:

Publisher: IEEE
Conference Location: Taipei, Taiwan

References

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