Abstract:
The relation between opamp noise and the size of the level shifting capacitor in correlated level-shifting (CLS) architectures is explored. Analysis is performed for a Sp...Show MoreMetadata
Abstract:
The relation between opamp noise and the size of the level shifting capacitor in correlated level-shifting (CLS) architectures is explored. Analysis is performed for a Split-CLS switched capacitor amplification circuit, and many of the conclusions in this paper are applicable to more general CLS architectures as well. A theoretical model for noise is developed and shown to be in good agreement with simulation. It is found that for practical design values, the size of the level-shifting capacitor only weakly influences noise performance.
Date of Conference: 20-23 May 2012
Date Added to IEEE Xplore: 20 August 2012
ISBN Information: