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The effect of correlated level shifting on noise performance in switched capacitor circuits | IEEE Conference Publication | IEEE Xplore

The effect of correlated level shifting on noise performance in switched capacitor circuits


Abstract:

The relation between opamp noise and the size of the level shifting capacitor in correlated level-shifting (CLS) architectures is explored. Analysis is performed for a Sp...Show More

Abstract:

The relation between opamp noise and the size of the level shifting capacitor in correlated level-shifting (CLS) architectures is explored. Analysis is performed for a Split-CLS switched capacitor amplification circuit, and many of the conclusions in this paper are applicable to more general CLS architectures as well. A theoretical model for noise is developed and shown to be in good agreement with simulation. It is found that for practical design values, the size of the level-shifting capacitor only weakly influences noise performance.
Date of Conference: 20-23 May 2012
Date Added to IEEE Xplore: 20 August 2012
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Conference Location: Seoul, Korea (South)

References

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