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Variability analysis of a hybrid CMOS/RS nanoelectronic calibration circuit | IEEE Conference Publication | IEEE Xplore

Variability analysis of a hybrid CMOS/RS nanoelectronic calibration circuit


Abstract:

In this paper, a novel adaptable reference circuit is proposed which can be used to calibrate the switching threshold of a read amplifier. The circuit is based on a netwo...Show More

Abstract:

In this paper, a novel adaptable reference circuit is proposed which can be used to calibrate the switching threshold of a read amplifier. The circuit is based on a network of nanoelectronic resistive switches acting as voltage dividers. In addition, active CMOS circuits are included which are used to tune the output voltage of the circuit. For the performance analysis variability models were applied for both, the CMOS part as well as the resistive switch part. The analysis shows that the output voltage can achieve a resolution for the reference voltage considerably better than 5mV. Finally, the tradeoff between resolution and required programming time is elaborated.
Date of Conference: 01-05 June 2014
Date Added to IEEE Xplore: 26 July 2014
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Conference Location: Melbourne, VIC, Australia

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