Physical Unclonable Functions (PUFs) offer the possibility to produce unique fingerprints for integrated circuits. As raw PUF responses are affected by noise, some post-processing steps are necessary. We present a coding chain test framework for PUFs on Field Programmable Gate Arrays. The framework allows easy exchange, evaluation and comparison of different PUF implementations, coding algorithms and other chain modules. For a testing framework, the execution time of the evaluated algorithm is a bottleneck, since a huge amount of runs are supposed to be done. Hence, we additionally present a new type of Reed-Muller decoder hardware architecture using parallel modules to speed up the decoding process. The decoding time could be decreased by 95% in comparison to existing implementations at the cost of 41 times higher slice count.