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An Adaptive Dead-Time Control Method for Gate Drivers Using Gate Current Measurement Enabling ZVS in High Frequency HV DC-DC Converters | IEEE Conference Publication | IEEE Xplore

An Adaptive Dead-Time Control Method for Gate Drivers Using Gate Current Measurement Enabling ZVS in High Frequency HV DC-DC Converters


Abstract:

This work presents a novel zero-voltage-switching technique and demonstrates its feasibility in two exemplary DC-DC buck converters. The proposed system makes use of the ...Show More

Abstract:

This work presents a novel zero-voltage-switching technique and demonstrates its feasibility in two exemplary DC-DC buck converters. The proposed system makes use of the nonlinearity of the reverse transfer capacitance to infer the voltage across the switch. The proposed method does not require additional expensive high-voltage components at the switch node, without resorting to bandwidth and voltage-limited high-voltage processes. The concept allows for full integration in low-cost, high-performance CMOS nodes, thereby enabling modern gate drivers with additional intelligent digital feature-sets to be used in HV environments. The technique is demonstrated to work using 650 V GaN and SiC switches across wide ranges of dead-times, regulating these from hundreds down to single nanoseconds.
Date of Conference: 21-25 May 2023
Date Added to IEEE Xplore: 21 July 2023
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Conference Location: Monterey, CA, USA

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