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Probabilistic exhibition information estimation model for optimal configuration of exhibition space | IEEE Conference Publication | IEEE Xplore

Probabilistic exhibition information estimation model for optimal configuration of exhibition space


Abstract:

We present an exhibition information model (EIM) by analyzing quantitative data for curators to configure the exhibition space. The proposed method consists of three step...Show More

Abstract:

We present an exhibition information model (EIM) by analyzing quantitative data for curators to configure the exhibition space. The proposed method consists of three steps: i) probabilistic interest prediction model (IPM), ii) mutual interest-based time prediction, and iii) spatial analysis for path prediction. The proposed method can be simulated in advance using the information of visitors and characteristics of the exhibition. The proposed simulation method can be applied to analyze the visitor's behavior by detecting and tracking moving objects.
Date of Conference: 24-26 June 2015
Date Added to IEEE Xplore: 06 August 2015
Electronic ISBN:978-1-4673-7365-4

ISSN Information:

Conference Location: Madrid, Spain

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